JPH048973U - - Google Patents
Info
- Publication number
- JPH048973U JPH048973U JP4994790U JP4994790U JPH048973U JP H048973 U JPH048973 U JP H048973U JP 4994790 U JP4994790 U JP 4994790U JP 4994790 U JP4994790 U JP 4994790U JP H048973 U JPH048973 U JP H048973U
- Authority
- JP
- Japan
- Prior art keywords
- chip group
- insulating holder
- electrodes
- probes
- fixed
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4994790U JPH048973U (en]) | 1990-05-14 | 1990-05-14 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4994790U JPH048973U (en]) | 1990-05-14 | 1990-05-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH048973U true JPH048973U (en]) | 1992-01-27 |
Family
ID=31568075
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4994790U Pending JPH048973U (en]) | 1990-05-14 | 1990-05-14 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH048973U (en]) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008170441A (ja) * | 2007-01-08 | 2008-07-24 | Mjc Probe Inc | 高周波プローブ及びプローブカード |
| JP2020159923A (ja) * | 2019-03-27 | 2020-10-01 | 京セラ株式会社 | 回路基板、プローブカードおよび検査装置 |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5717143A (en) * | 1980-07-03 | 1982-01-28 | Nippon Denshi Zairyo Kk | Probe for test of semiconductor wafer |
| JPH0237378B2 (ja) * | 1980-02-27 | 1990-08-23 | Sekisui Chemical Co Ltd | Enkabinirujushiraininguyosetsuchakuzai |
-
1990
- 1990-05-14 JP JP4994790U patent/JPH048973U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0237378B2 (ja) * | 1980-02-27 | 1990-08-23 | Sekisui Chemical Co Ltd | Enkabinirujushiraininguyosetsuchakuzai |
| JPS5717143A (en) * | 1980-07-03 | 1982-01-28 | Nippon Denshi Zairyo Kk | Probe for test of semiconductor wafer |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2008170441A (ja) * | 2007-01-08 | 2008-07-24 | Mjc Probe Inc | 高周波プローブ及びプローブカード |
| JP2020159923A (ja) * | 2019-03-27 | 2020-10-01 | 京セラ株式会社 | 回路基板、プローブカードおよび検査装置 |